THE DUAL LIGHT SCATTERING PARTICLE SIZE ANALYZER OF THE NANO DS
- DLS & SLS
- Dual Technology
- Multi-angle DLS
- Repeatability <1%
- Maintenance-free design
- Multi-peak size distribution measurements
The Nano DS is the first Nanoparticle Size Analyzer to combine Dynamic Light Scattering (DLS) and Static Light Scattering (SLS) in the same particle size instrument. This ensures accurate particle size measurements across the entire measurement range, from 0.3 nm to 10 microns, and eliminates many of the shortcomings of instruments using only Dynamic Light Scattering.
DLS is not that effective when analyzing larger particle and blended products. To overcome this technical limitation, CILAS has developed the Nano DS, which seamlessly integrates both Dynamic and Static Light Scattering.
The Nano DS ensures accurate nanoparticle characterization results even if the sample is agglomerated or has a multi-modal size distribution. This innovative new technology provides the user with the best accuracy and repeatability over the entire 0.3 nm to 10 micron size range.
Besides, the Nano DS is provided with the first multi-angle DLS analysis on the market. With detection from 10° to 150°, this instrument allows Back Scattering DLS measurements for non-diluted samples. The Nano Expert software provides a fast multi-angles scanning protocol as well as user defined protocol for complex R&D needs.
The Nano DS features a solid state laser diode technology. This laser diode has a higher life time than laser gas source to ensure low cost maintenance and no costly periodic replacement of the laser. The laser diode technology needs only a very short warm-up time (<2mn), and its excellent thermal stability improves the repeatability of the instrument. Its high sensitivity detector, using the PMT (Photo Multiplier Tube) technology, has an excellent signal noise ratio, which ensures better and faster results.
The use of the Nano DS is intuitive, the measurement and analysis are controlled directly by the user through user-friendly software: the Nano Expert. The measurement sequence can be launched with just one click. The real time 3D Mimic screen allows the user to visualize simply all step of the analysis process and the position of the mobile detector. The software is compatible with the latest versions of Windows. An automatic report editing system is embedded in the software to facilitate data management, results comparison and report retrieval.
The Nano DS is the most compact instrument that combines static and dynamic light scattering. With its 14kg, the Nano DS is a portable instrument, and its small footprint allows customers to save place. The Nano DS needs no regular maintenance and no calibration, which means real time and money savings for customers. Its low energy consumption also participates to these savings.
The Nano DS is compliant with the ISO 13321& 13322 standard for Particle Size Analyzers as well as the 21 CFR-Part 11.
|Particle size range||0.3 nm to 10 μm|
|Sample concentration||Up to 40% (V)|
|Repeatability||Better than 1%|
|Technology||Technology Static & Dynamic Multi angle Laser Light Scattering (SLS & DLS)|
|Scattering angle||From 10° (front scattering) to 150° (back scattering), angle resolution 0.01°|
|Light source||Laser Diode @ 638 nm- 25mW|
|Sample volume||3 mL|
|Photon counting unit||High sensitive Photon counter based on PMT|
|Measurement time||30 s to 60 s depending on sample and protocol|
|Sample setting temperature||25°C|
|Cuvette Type||Glass cuvette compatible with organic solvents, plastic cuvette|
|Ambient Temperature||+10 to +40 °C|
|Warm up time||< 2 min|
|Product Dimensions||W: 341 mm, H: 218 mm, L: 533 mm|
|Product Weight||14.5 kg|
|Shipping Dimensions||W: 500 mm, H: 300 mm, L: 690 mm|
|Operating System||Windows 7 32 & 64bits, XP Pro 32 bits|
|Computer configuration||Computer configuration Compatible with OS, RAM 4 Go, 1 port USB 2.0 for the device|
|Power supply||115V/60Hz – 230V/50Hz, 60W|
|Analysis Software NanoExpert||Performs multi-acquisition at user defined angles. Features cumulant, Contin inversion algorithms, size distribution, Integrated Database for SOP and results management, export to Excel and PDF format, user account management.|
|Metrology Std.||Compliance with CFR21part11, ISO 13320 and 13321, ISO 22412:2008|
|Laser Safety classification||Class I compliant EN 60825-1:2008 & 21 CFR-1040|
|EC regulatory std.||EMC : directive 2004-108/EC
Electrical Safety : directive 2006/95/EC
|Delivered with||USB 2.0 cable, NanoExpert software|
|CRM kit (optional)||NIST traceable 100 nm latex spheres sample for periodic verification|
|–||All performances are sample dependent|
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